Zernike-type X-ray imaging microscopy at 25 keV with Fresnel zone plate optics

M. Awaji, Y. Suzuki, A. Takeuchi, H. Takano, N. Kamijo, S. Tamura, M. Yasumoto

研究成果: Article査読

19 被引用数 (Scopus)

抄録

A Zernike-type imaging microscope using a sputtered-sliced Fresnel zone plate (SS-FZP) has been developed and tested at an X-ray energy of 25 keV. The SS-FZP was used as an objective. A copper (Cu) phase plate was placed at the back focal plane of the SS-FZP in order to produce phase contrast. The performance of the Zerniketype imaging microscope was tested with a gold (Au) mesh and a resolution test pattern at undulator beamline 47 of SPring-& The Au mesh and the resolution test pattern could be imaged in transmission with a magnification of × 10.2. Owing to the Cu phase plate, different image contrast was observed compared with the bright-field image contrast. Tantalum microstructures down to 0.5 μm line-and-space have been observed on spatial resolution test patterns.

本文言語English
ページ(範囲)125-127
ページ数3
ジャーナルJournal of Synchrotron Radiation
9
3
DOI
出版ステータスPublished - 2002 5月 1
外部発表はい

ASJC Scopus subject areas

  • 放射線
  • 核物理学および高エネルギー物理学
  • 器械工学

フィンガープリント

「Zernike-type X-ray imaging microscopy at 25 keV with Fresnel zone plate optics」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル