TY - JOUR
T1 - XPS study of the effect of Ar-ion bombardment and aging on surface properties of superionic conducting glass (CuI)0.3(Cu2O)0.35(MoO3) 0.35
AU - Suzuki, Shigeru
AU - Saito, Masatoshi
AU - Kang, Shinchul C.
AU - Jacob, Kallarackel T.
AU - Waseda, Yoshio
PY - 1998/10
Y1 - 1998/10
N2 - XPS analysis has been used for characterizing the effects of argon-ion bombardment and aging at room temperature on the surface properties of the superionic conducting glass having the composition (CuI)0.3(Cu2O)0.35(MoO3) 0.35. Copper and molybdenum ions in this particular glass are found to be significantly reduced by argon-ion bombardment, Cu2+ to Cu0 and Mo6+ to Mo4+. The chemical change is attributed to preferential sputtering of iodine and oxygen from the surface of the glass. The concentration of copper on the surface increases and that of molybdenum decreases with aging at room temperature. From aging curves, the diffusion coefficient of copper is estimated to be of the order of 10-23 m2-s-1.
AB - XPS analysis has been used for characterizing the effects of argon-ion bombardment and aging at room temperature on the surface properties of the superionic conducting glass having the composition (CuI)0.3(Cu2O)0.35(MoO3) 0.35. Copper and molybdenum ions in this particular glass are found to be significantly reduced by argon-ion bombardment, Cu2+ to Cu0 and Mo6+ to Mo4+. The chemical change is attributed to preferential sputtering of iodine and oxygen from the surface of the glass. The concentration of copper on the surface increases and that of molybdenum decreases with aging at room temperature. From aging curves, the diffusion coefficient of copper is estimated to be of the order of 10-23 m2-s-1.
KW - (CuI)-(CuO)-(MoO) system
KW - Diffusion coefficient of copper
KW - Ion bombardment
KW - Superionic conducting glass
KW - X-ray photoelectron spectroscopy
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U2 - 10.2320/matertrans1989.39.1024
DO - 10.2320/matertrans1989.39.1024
M3 - Article
AN - SCOPUS:0032182785
VL - 39
SP - 1024
EP - 1028
JO - Materials Transactions
JF - Materials Transactions
SN - 1345-9678
IS - 10
ER -