抄録
Informatics tools are an important part of the high-throughput or combinatorial materials development process. Particularly for thin film studies, the rate of sample synthesis and characterization has increased to a point where the throughput of the whole materials development process is limited by the ability to process the characterization data and design new experiments. We describe in this work software tools that we have developed to solve the data management problems. In particular, we discuss the use of extensible markup language (XML) to address the problem of representing structurally varied experimental data in a data management system without having to make modifications to the core software parts whenever the materials processing or characterization tools or sample and data handling procedures change.
本文言語 | English |
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ページ(範囲) | 2634-2639 |
ページ数 | 6 |
ジャーナル | Applied Surface Science |
巻 | 252 |
号 | 7 |
DOI | |
出版ステータス | Published - 2006 1 21 |
外部発表 | はい |
イベント | Proceedings of the Third Japan-US Workshop on Combinatorial Material Science and Technology CMST-e SI - 継続期間: 2004 12 7 → 2004 12 10 |
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films