X-ray pinpoint structural measurement for nanomaterials and devices at BL40XU of the SPring-8

Shigeru Kimura, Yutaka Moritomo, Yoshihito Tanaka, Hitoshi Tanaka, Koshiro Toriumi, Kenichi Kato, Nobuhiro Yasuda, Yoshimitsu Fukuyama, Jungeun Kim, Haruno Murayama, Masaki Takata

研究成果: Conference contribution

14 被引用数 (Scopus)

抄録

The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, "x-ray pinpoint structural measurement", which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of "x-ray pinpoint structural measurement" technique are, 1) spatial resolution: ∼ 100 nm, 2) time resolution: ∼ 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity.

本文言語English
ホスト出版物のタイトルSYNCHROTRON RADIATION INSTRUMENTATION
ホスト出版物のサブタイトルNinth International Conference on Synchrotron Radiation Instrumentation
ページ1238-1241
ページ数4
DOI
出版ステータスPublished - 2007 3 26
外部発表はい
イベントSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
継続期間: 2006 5 282006 6 28

出版物シリーズ

名前AIP Conference Proceedings
879
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
CountryKorea, Republic of
CityDaegu
Period06/5/2806/6/28

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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