X-ray phase scanning setup for non-destructive testing using Talbot-Lau interferometer

S. Bachche, M. Nonoguchi, K. Kato, M. Kageyama, T. Koike, M. Kuribayashi, A. Momose

研究成果: Conference contribution

3 被引用数 (Scopus)

抄録

X-ray grating interferometry has a great potential for X-ray phase imaging over conventional X-ray absorption imaging which does not provide significant contrast for weakly absorbing objects and soft biological tissues. X-ray Talbot and Talbot-Lau interferometers which are composed of transmission gratings and measure the differential X-ray phase shifts have gained popularity because they operate with polychromatic beams. In X-ray radiography, especially for nondestructive testing in industrial applications, the feasibility of continuous sample scanning is not yet completely revealed. A scanning setup is frequently advantageous when compared to a direct 2D static image acquisition in terms of field of view, exposure time, illuminating radiation, etc. This paper demonstrates an efficient scanning setup for grating-based Xray phase imaging using laboratory-based X-ray source. An apparatus consisting of an X-ray source that emits X-rays vertically, optical gratings and a photon-counting detector was used with which continuously moving objects across the field of view as that of conveyor belt system can be imaged. The imaging performance of phase scanner was tested by scanning a long continuous moving sample at a speed of 5 mm/s and absorption, differential-phase and visibility images were generated by processing non-uniform moire movie with our specially designed phase measurement algorithm. A brief discussion on the feasibility of phase scanner with scanning setup approach including X-ray phase imaging performance is reported. The successful results suggest a breakthrough for scanning objects those are moving continuously on conveyor belt system non-destructively using the scheme of X-ray phase imaging.

本文言語English
ホスト出版物のタイトルAdvances in Laboratory-Based X-Ray Sources, Optics, and Applications V
編集者Gert E. van Dorssen, Ali M. Khounsary
出版社SPIE
ISBN(電子版)9781510603196
DOI
出版ステータスPublished - 2016
外部発表はい
イベントAdvances in Laboratory-Based X-Ray Sources, Optics, and Applications V - San Diego, United States
継続期間: 2016 8 302016 8 31

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
9964
ISSN(印刷版)0277-786X
ISSN(電子版)1996-756X

Other

OtherAdvances in Laboratory-Based X-Ray Sources, Optics, and Applications V
国/地域United States
CitySan Diego
Period16/8/3016/8/31

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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