X-ray fluorescence holography of 0.078 wt% copper in silicon steel

Kouichi Hayashi, Tetsutaro Hayashi, Yukio Takahashi, Shigeru Suzuki, Eiichiro Matsubara

研究成果: Conference article査読

7 被引用数 (Scopus)

抄録

X-ray fluorescence holograms of 0.078 wt% Cu in silicon steel were measured at a synchrotron radiation facility, SPring-8. The present fluorescent X-ray detection system combining a toroidally bent graphite analyzer and an avalanche photodiode enables us to record high-quality holograms by eliminating a strong Fe fluorescence from the sample. The reconstructed atomic image around Cu shows a bcc lattice, which indicates the presence of Cu in an α-Fe lattice.

本文言語English
ページ(範囲)192-195
ページ数4
ジャーナルNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
238
1-4
DOI
出版ステータスPublished - 2005 8
イベントSynchrotron Radiation in Materials Science Proceedings of the 4th Conference on Synchrotron Radiation in Materials Science -
継続期間: 2004 8 232004 8 25

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 器械工学

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