X-Ray fluorescence analysis by multiple-glancing x-ray beam excitation

Kouichi Tsuji, Tasaku Sato, Kazuaki Wagatsuma

研究成果: Article査読

3 被引用数 (Scopus)

抄録

Total-reflection X-ray fluorescence analysis is usually carried out using a single X-ray beam to irradiate a sample surface at a glancing angle from one direction. We have attempted to conduct X-ray fluorescence analysis using multiple glancing X-ray beams emitted from a glow discharge X-ray tube. Fe characteristic X-rays were used as the primary X-rays to irradiate a thin Cr film (sample) on a flat acrylic carrier at multiple glancing angles. We have concluded that multiple X-ray beam excitation is an effective method for enhancement of X-ray fluorescence intensity.

本文言語English
ページ(範囲)5821-5822
ページ数2
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
37
10
DOI
出版ステータスPublished - 1998 10月
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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