Write margin measurement of bit patterned media with 20 nm dots

Hideki Saga, Kazuki Shirahata, Ryo Terashima, Takehito Shimatsu, Hajime Aoi, Hiroaki Muraoka

研究成果: Article査読

抄録

Bit-patterned media (BPM) with 20 nm diameter dots and a 72 nm dot period were fabricated from hard/soft-stacked base media with a [Co/Pt]-super-lattice hard layer and a Co soft layer. The write margin of synchronous recording was evaluated using a static tester. All recorded dots were in single domain state, as expected from previous experiments. The write margin was about 50 nm, and there was a total margin loss almost corresponding to the dot diameter. According to an analysis of margin loss factors based on the slope recording model, the margin loss factors for compensating effect of multidomain dots decreased drastically. Therefore it was confirmed that the slope recording model well illustrated the recording process of small dots in single-domain states. The margin loss factor due to the dot position jitter was 17.7 nm p-p and became the dominant loss factor. The loss factor attributable to the switching field distribution also increased rapidly to 11.3 nm p-p and was the second largest loss factor. To secure a sufficient write margin for a robust recording system, suppression of these degradation factors in the BPM fabrication process is required.

本文言語English
論文番号6332913
ページ(範囲)3723-3726
ページ数4
ジャーナルIEEE Transactions on Magnetics
48
11
DOI
出版ステータスPublished - 2012

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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