Weissenberg reflection high-energy electron diffraction for surface crystallography

Tadashi Abukawa, Tomoyuki Yamazaki, Kentaro Yajima, Koji Yoshimura

研究成果: Article査読

16 被引用数 (Scopus)

抄録

The principle of a Weissenberg camera is applied to surface crystallographic analysis by reflection high-energy electron diffraction. By removing inelastic electrons and measuring hundreds of patterns as a function of sample rotation angle, kinematical analysis can be performed over a large volume of reciprocal space. The data set is equivalent to a three-dimensional stack of Weissenberg photographs. The method is applied to analysis of an Si(111)-3×3-Ag surface, and the structural data obtained are in excellent agreement with the known atomic structure.

本文言語English
論文番号245502
ジャーナルPhysical review letters
97
24
DOI
出版ステータスPublished - 2006

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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