Visualization of the recovery process of defects in a cultured cell layer by chemical imaging sensor

Ko ichiro Miyamoto, Bing Yu, Hiroko Isoda, Torsten Wagner, Michael J. Schöning, Tatsuo Yoshinobu

研究成果: Article査読

9 被引用数 (Scopus)

抄録

The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel cell assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the recovery of defects in a cell layer brought into proximity of the sensing surface. A reduced impedance at a defect formed artificially in a cell layer was successfully visualized in a photocurrent image. The cell layer was cultured over two weeks, during which the temporal change of the photocurrent distribution corresponding to the recovery of the defect was observed.

本文言語English
ページ(範囲)965-969
ページ数5
ジャーナルSensors and Actuators, B: Chemical
236
DOI
出版ステータスPublished - 2016 11 29

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 器械工学
  • 凝縮系物理学
  • 表面、皮膜および薄膜
  • 金属および合金
  • 電子工学および電気工学
  • 材料化学

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