Visualization of defects on a cultured cell layer by utilizing chemical imaging sensor

Ko Ichiro Miyamoto, Yu Bing, Torsten Wagner, Tatsuo Yoshinobu, Michael J. Schöning

研究成果: Conference article査読

2 被引用数 (Scopus)

抄録

The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface. A reduced impedance inside the defect, which was artificially formed in a cell layer, was successfully visualized in a photocurrent image.

本文言語English
ページ(範囲)936-939
ページ数4
ジャーナルProcedia Engineering
120
DOI
出版ステータスPublished - 2015
イベント29th European Conference on Solid-State Transducers, EUROSENSORS 2015; Freiburg; Germany; 6 September 2015 through 9 September 2015. - Freiburg, Germany
継続期間: 2015 9 62015 9 9

ASJC Scopus subject areas

  • 工学(全般)

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