Variation-effect analysis of MTJ-based multiple-valued programmable resistors

研究成果: Conference contribution

抄録

Nonvolatile multiple-valued programmable resistors based on series-parallel-connected magnetic tunnel junction (MTJ) devices are proposed for process-variation-resilient logic LSIs. Since the proposed resistors are designed using several MTJ devices of equal size, they can be fabricated without using special fabrication technologies such as that used to fabricate conventional MTJ-based multilevel resistors. In this paper, the process variation tolerance of the proposed resistors is evaluated through the Monte-Carlo analysis using a SPICE simulator with built-in MTJ device model.

本文言語English
ホスト出版物のタイトルProceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014
出版社IEEE Computer Society
ページ243-247
ページ数5
ISBN(印刷版)9781479935345
DOI
出版ステータスPublished - 2014
イベント44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014 - Bremen, Germany
継続期間: 2014 5 192014 5 21

出版物シリーズ

名前Proceedings of The International Symposium on Multiple-Valued Logic
ISSN(印刷版)0195-623X

Other

Other44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014
国/地域Germany
CityBremen
Period14/5/1914/5/21

ASJC Scopus subject areas

  • コンピュータ サイエンス(全般)
  • 数学 (全般)

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