Using an electroconductive carbon nanotube probe tip in scanning nonlinear dielectric microscopy

K. Ishikawa, Y. Cho

研究成果: Article査読

3 被引用数 (Scopus)

抄録

A scanning nonlinear dielectric microscope (SNDM), which can be used for detecting the surface and subsurface of ferroelectric polarization with high resolution, has been developed. Contact-mode atomic force microscopy typically uses a metal-coated conductive cantilever tip; however, SNDM imaging resolution declines upon repeated scanning because of the abrasion of the tip in the contact mode. To improve the lateral resolution of the tip, we used an electroconductive carbon nanotube (CNT) probe tip. Using the SNDM with the CNT probe, the ferroelectric domain boundary of stoichiometric lithium tantalate (LiTa O3) is observed in air at room temperature and the results compared with those obtained using a platinum-coated tip.

本文言語English
論文番号103708
ジャーナルReview of Scientific Instruments
77
10
DOI
出版ステータスPublished - 2006 11 7

ASJC Scopus subject areas

  • 器械工学

フィンガープリント

「Using an electroconductive carbon nanotube probe tip in scanning nonlinear dielectric microscopy」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル