Transmission electron microscopic observation of thermally introduced planar faults in Fe-35 mol.% Al alloys

Kyosuke Yoshimi, Shuji Hanada, Tsuyoshi Onuma, Man H. Yoo

研究成果: Article査読

30 被引用数 (Scopus)

抄録

Thermally introduced planar faults are investigated both in an Fe-35 mol.%Al binary alloy and in B, Cr, Pd and W added ternary alloys using transmission electron microscopy. Air cooling of the alloys from 1273 K followed by annealing at 698 K for 120 h introduces two types of planar faults. One type is the antiphase boundary (APB), which is observed in all of the alloys. The other is the complex planar fault having both APB and stacking fault characters, which is observed in only the B-added alloy. The formation of the APBs is envisaged from a collapse of the lattice owing to vacancy condensation on triple layers of (111) planes. The size, distribution and planarity of the APBs are affected by ternary element addition.

本文言語English
ページ(範囲)443-456
ページ数14
ジャーナルPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
73
2
DOI
出版ステータスPublished - 1996 2

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 材料科学(全般)
  • 凝縮系物理学
  • 物理学および天文学(その他)
  • 金属および合金

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