Topological bumped surface induced by the lattice extension of the RuCr intermediate layer for granular-type perpendicular recording media

Shinji Yonemura, Shin Saito, Atsushi Hashimoto, Migaku Takahashi

研究成果: Article査読

10 被引用数 (Scopus)

抄録

Surface roughness caused by the grain growth of the RuCr non-magnetic intermediate layer (NMIL) was evaluated using the X-ray total reflection method. In the case of Ru NMIL, the value of root mean square roughness of NMIL (σ) increases from 0.59 to 1.45 nm with increase in Ar gas pressure and/or thickness of the Ru layer. Judging from the loop slope and normalized coercivity, the degree of magnetic isolation increases as σ increases, independent of the Cr content of a RuCr NMIL. Furthermore, it was found that σ of NMIL is strongly correlated with wettability to the seed layer material and is enhanced by the lattice extension of NMIL.

本文言語English
ページ(範囲)3053-3056
ページ数4
ジャーナルJournal of Magnetism and Magnetic Materials
320
22
DOI
出版ステータスPublished - 2008 11 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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