TY - JOUR
T1 - TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions
AU - Nishinomiya, S.
AU - Toshin, K.
AU - Shishido, R.
AU - Suzuki, S.
PY - 2016/11/1
Y1 - 2016/11/1
N2 - In recent years, secondary ion mass spectrometry (SIMS) with a time-of-flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF-SIMS with a cluster ion beam (Aun, Bin, C60, Arn, etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF-SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C5H7N6 + (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.
AB - In recent years, secondary ion mass spectrometry (SIMS) with a time-of-flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF-SIMS with a cluster ion beam (Aun, Bin, C60, Arn, etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF-SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C5H7N6 + (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.
KW - Bi-cluster
KW - SIMS
KW - melamine self-condensation
KW - paint film
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U2 - 10.1002/sia.6087
DO - 10.1002/sia.6087
M3 - Article
AN - SCOPUS:84980047862
SN - 0142-2421
VL - 48
SP - 1114
EP - 1118
JO - Surface and Interface Analysis
JF - Surface and Interface Analysis
IS - 11
ER -