Time-resolved X-ray photoelectron diffraction using an angle-resolved time-of-flight electron analyzer

Artoni Kevin R. Ang, Yuichiro Fukatsu, Koji Kimura, Yuta Yamamoto, Takahiro Yonezawa, Hirokazu Nitta, Antoine Fleurence, Susumu Yamamoto, Iwao Matsuda, Yukiko Yamada-Takamura, Kouichi Hayashi

研究成果: Article査読

抄録

X-ray photoelectron diffraction (XPD) provides atomic resolution, element sensitive local structure information about the surfaces and interfaces of materials. In the work reported in this paper, a two-dimensional angle resolved time-of-flight (2DARTOF) system is used to perform time-resolved XPD experiments on epitaxial silicene. The two Si 2p peak components from the different atomic sites in the silicene layer allow extraction of the individual XPD patterns. Time-resolved measurements captured small angle shifts in the forward focusing peak, indicating laser-induced changes in the silicene structure. At 10 ns, the XPD patterns appear to relax back to the equilibrium state. This work demonstrates that 2DARTOF systems are well suitable for time-resolved XPD measurements.

本文言語English
論文番号100902
ジャーナルJapanese journal of applied physics
59
10
DOI
出版ステータスPublished - 2020 10 1
外部発表はい

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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