Three-dimensional electron density mapping of shape-controlled nanoparticle by focused hard X-ray diffraction microscopy

Yukio Takahashi, Nobuyuki Zettsu, Yoshinori Nishino, Ryosuke Tsutsumi, Eiichiro Matsubara, Tetsuya Ishikawa, Kazuto Yamauchi

研究成果: Article査読

57 被引用数 (Scopus)

抄録

Coherent diffraction microscopy using highly focused hard X-ray beams allows us to three-dimensionally observe thick objects with a high spatial resolution, also providing us with unique structural information, i.e., electron density distribution, not obtained by X-ray tomography with lenses, atom probe microscopy, or electron tomography. We measured high-contrast coherent X-ray diffraction patterns of a shape-controlled Au/Ag nanoparticle and successfully reconstructed a projection and a three-dimensional image of the nanoparticle with a single pixel (or a voxel) size of 4.2 nm in each dimension. The small pits on the surface and a hollow interior were clearly visible. The Au-rich regions were identified based on the electron density distribution, which provided insight into the formation of Au/Ag nanoboxes.

本文言語English
ページ(範囲)1922-1926
ページ数5
ジャーナルNano Letters
10
5
DOI
出版ステータスPublished - 2010 5 12
外部発表はい

ASJC Scopus subject areas

  • バイオエンジニアリング
  • 化学 (全般)
  • 材料科学(全般)
  • 凝縮系物理学
  • 機械工学

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