Thickness reduction in CoPtCr-SiO2 perpendicular recording media to improve media performance

T. Shimatsu, T. Oikawa, Y. Inaba, Hideo Sato, I. Watanabe, H. Aoi, Hiroaki Muraoka, Y. Nakamura

研究成果: Article査読

18 被引用数 (Scopus)


Magnetic properties and recording performance of thin CoPtCr-SiO 2 media were examined in relation to thermal stability. Magnetic anisotropy Ku of {(Co90Cr10) 80Pt20}89-(SiO2)11 media maintains a constant value of around 5.5 × 106 erg/cm 3, even at film thickness of 4 nm. This Ku value corresponds to the anisotropy energy of the grains Ku9 calculated by taking account of the volume fraction of about 8 × 10 6 erg/cm3, indicating a high potential to resist thermal agitation. The high Ku derives a high remanence corcivity H r of ∼ 4 kOe, even at film thickness of 8 nm, resulting in a loop squareness of nearly 1. The ratio of magnetic anisotropy energy to thermal energy KuVactkT maintained a value of more than 70, even at this thickness. The media noise at low recording density increases with decreasing film thickness below 8 nm, probably due to the thermal agitation. The recording resolution D50 showed a broad maximum of ∼ 420 kFCI at around this thickness. The reduction in Sim thickness improves recording resolution; however, it is likely that the large thermal agitation in the thin-film region degrades the recording resolution, resulting in an optimum thickness to show the highest recording resolution.

ジャーナルIEEE Transactions on Magnetics
4 II
出版ステータスPublished - 2004 7月

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学


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