Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling

V. A. Chernenko, M. Kohl, M. Ohtsuka, T. Takagi, V. A. L'vov, V. M. Kniazkyi

研究成果: Article査読

22 被引用数 (Scopus)

抄録

A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.

本文言語English
ページ(範囲)944-947
ページ数4
ジャーナルMaterials Science and Engineering A
438-440
SPEC. ISS.
DOI
出版ステータスPublished - 2006 11 25

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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