抄録
Ge- and Ti-doped silica thin films were prepared upon various substrates by solgel processing and rf sputtering. Large second-harmonic generation was measured from thermally poled thin-film samples. The origin of nonlinearity and its distribution from thermally poled silicate thin films were investigated. Moreover, we measured the stability of the nonlinearity of a rf-sputtered germanosilicate thin film upon a silica glass substrate against heat and intense laser light sufficient for the fabrication of waveguide-type nonlinear optical devices.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 421-425 |
| ページ数 | 5 |
| ジャーナル | Journal of the Optical Society of America B: Optical Physics |
| 巻 | 15 |
| 号 | 1 |
| DOI | |
| 出版ステータス | Published - 1998 1月 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 統計物理学および非線形物理学
- 原子分子物理学および光学