Theory for the atomic force microscopy of layered elastic surfaces

G. Overney, D. Tomanek, W. Zhong, Z. Sun, Hiroshi Miyazaki, S. D. Mahanti, H. J. Guntherodt

研究成果: Article査読

18 被引用数 (Scopus)

抄録

The authors present a first-principles theory of atomic force microscopy (AFM) on layered elastic surfaces. Substrate distortions due to the AFM tip and intercalant impurities are described within continuum elasticity theory, using elastic constants determined from ab initio density functional calculations. They apply this theory to graphite and calculate local distortions in the vicinity of an AFM tip and/or an intercalant atom. Using this formalism, they discuss the effect of a finite size tip (or a graphite flake attached to the tip) on the substrate distortions and the resulting AFM image. The authors calculations show that the AFM should be a unique tool to determine the local surface rigidity and the healing length of graphite near structural impurities.

本文言語English
論文番号002
ページ(範囲)4233-4249
ページ数17
ジャーナルJournal of Physics: Condensed Matter
4
17
DOI
出版ステータスPublished - 1992 12 1

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

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