The study on ferromagnetic resonance linewidth for NM/80NiFe/NM (NM = Cu, Ta, Pd and Pt) films

S. Mizukami, Y. Ando, T. Miyazaki

研究成果: Article査読

281 被引用数 (Scopus)

抄録

The out-of-plane angular dependence of ferromagnetic resonance (FMR) was measured for NM/80NiFe(Py)/NM (NM = Cu, Ta, Pd and Pt) films with various Py, Cu and Ta thicknesses fabricated by magnetron sputtering. The out-of-plane angular dependences of FMR resonance field and linewidth were analyzed using Landau-Lifshitz-Gilbert equation taking account of broadening of linewidth due to magnetic inhomogeneities in a film. Magnetic inhomogeneities were assumed to be the fluctuation of magnitude and direction of the effective demagnetization field which contains both demagnetization and perpendicular anisotropy field for a film. The calculations of the angular variations of linewidth agreed with the experimental ones quantitatively. The fluctuations of magnitude and direction of the effective demagnetization field, which are represented as Δ (4π Meff.) and ΔθH, respectively, increased with decreasing Py thickness for all NM/Py/NM films. ΔθH increased as the thicknesses of the buffer layers increased for Cu/Py(40 Å)/Cu films and was almost constant with increasing buffer layer thickness for Ta/Py(40 Å)/Ta films. Only in the case of NM = Pd and Pt films, the Gilbert damping parameter, which is the speed of decay of magnetization precession, was enhanced significantly as compared with that for the bulk sample and was dependent on Py thickness.

本文言語English
ページ(範囲)580-585
ページ数6
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
40
2 A
DOI
出版ステータスPublished - 2001 2月

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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