The overlayer structure on the Si(001)-(2×3)-Ag surface determined by X-ray photoelectron diffraction

M. Shimomura, T. Abukawa, M. Higa, M. Nakamura, S. M. Shivaprasad, H. W. Yeom, S. Suzuki, S. Sato, J. Tani, S. Kono

研究成果: Article査読

15 被引用数 (Scopus)

抄録

X-ray photoelectron diffraction (XPD) patterns of Ag 3d electrons from a single domain Si(001)-(2 × 3)-Ag surface were examined. Single scattering cluster and multiple scattering cluster simulations of the Ag 3d XPD patterns indicate an overlayer that contains four Ag atoms aligned almost linearly along the threefold direction in the unit cell on the Si(001) surface. The four-Ag-atom arrangement is discussed in the light of other information obtained by STM, LEEM and photoemission studies, finding it very feasible.

本文言語English
ページ(範囲)953-958
ページ数6
ジャーナルSurface Review and Letters
5
5
DOI
出版ステータスPublished - 1998 1 1

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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