The observation of a transient surface morphology in the femtosecond laser ablation process by using the soft x-ray laser probe

Noboru Hasegawa, Masaharu Nishikino, Takuro Tomita, Naofumi Ohnishi, Atsushi M. Ito, Takashi Eyama, Naoya Kakimoto, Rui Idutsu, Yasuo Minami, Motoyoshi Baba, Anatoly Y. Faenov, Nail A. Inogamov, Tetsuya Kawachi, Mitsuru Yamagiwa, Tohru Suemoto

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

We have improved a soft x-ray laser (SXRL) interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot imaging of the nano-scaled structure dynamics of the laser induced materials. By the precise imaging optics and double time fiducial system having been installed, the lateral resolution on the sample surface and the precision of the temporal synchronization between the SXRL and Ti:Sapphire laser pulses were improved to be 700 nm and 2 ps, respectively. By using this system, the initial stage (t < 200 ps) of the ablation process of the Pt surface pumped by 80 fs Ti:Sapphire laser pulse was observed by the comparison between the soft x-ray reflective image and interferogram. We have succeeded in the direct observation of the unique ablation process around the ablation threshold such as the rapid increase of the surface roughness and surface vibration.

本文言語English
ホスト出版物のタイトルX-Ray Lasers and Coherent X-Ray Sources
ホスト出版物のサブタイトルDevelopment and Applications XI
編集者Annie Klisnick, Carmen S. Menoni
出版社SPIE
ISBN(電子版)9781628417555
DOI
出版ステータスPublished - 2015 1 1
イベントX-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI Conference - San Diego, United States
継続期間: 2015 8 122015 8 13

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
9589
ISSN(印刷版)0277-786X
ISSN(電子版)1996-756X

Other

OtherX-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI Conference
国/地域United States
CitySan Diego
Period15/8/1215/8/13

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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