Texture of submicron Ni-Mn-Ga films studied by X-ray diffraction at the ANKA synchrotron source

V. A. Chernenko, S. Doyle, M. Kohl, P. Müllner, S. Besseghini, M. Ohtsuka

研究成果: Article

8 引用 (Scopus)

抜粋

Texture measurements of two series of Ni-Mn-Ga thin films, sputter-deposited on Mo foils, are performed as a function of both film and substrate thickness. X-ray diffraction experiments were carried out at the SR source ANKA in Germany. In contrast to 1μm-thick films showing 220-fibre texture, both in-plane and out-of-plane texture components are found in submicron films which correlates with the enhanced magnetostrain effect in these films.

元の言語English
ページ(範囲)229-234
ページ数6
ジャーナルZeitschrift fur Kristallographie, Supplement
2
発行部数26
DOI
出版物ステータスPublished - 2007 1 1

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Inorganic Chemistry

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