Texture measurements of two series of Ni-Mn-Ga thin films, sputter-deposited on Mo foils, are performed as a function of both film and substrate thickness. X-ray diffraction experiments were carried out at the SR source ANKA in Germany. In contrast to 1μm-thick films showing 220-fibre texture, both in-plane and out-of-plane texture components are found in submicron films which correlates with the enhanced magnetostrain effect in these films.
|ジャーナル||Zeitschrift fur Kristallographie, Supplement|
|出版物ステータス||Published - 2007 1 1|
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Inorganic Chemistry