Temperature dependence of switching field distribution in a NiFe wire with a pad

K. Shigeto, K. Miyake, T. Okuno, K. Mibu, T. Ono, Y. Yokoyama, T. Kawagoe, Y. Suzuki, T. Shinjo

研究成果: Article査読

9 被引用数 (Scopus)

抄録

The distribution of switching fields (Hsw) in a NiFe wire was investigated as a function of temperature between 5 and 300 K. The sample structure under investigation is Ta/NiFe/Cu/NiFe wire (150 nm width) connecting to a square pad (large area) at an end. Magnetization reversal phenomena are very sensitively detected using the giant magnetoresistance effect. With repeating magnetoresistance measurements, we obtained a histogram of Hsw with three narrow peaks at each temperature. The origin of three peaks can be attributed to the existence of three different kinds of magnetic domain structures at the pad area, which was confirmed by magnetic force microscopy observation.

本文言語English
ページ(範囲)301-304
ページ数4
ジャーナルJournal of Magnetism and Magnetic Materials
240
1-3
DOI
出版ステータスPublished - 2002 2月

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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