Temperature dependence of exchange coupling in Mn75Ir 25/Co70Fe30/AlOx/Co 70Fe30/Ni80Fe20 MTJs

Y. K. Hu, S. M. Yoon, J. J. Lim, V. K. Sankaranarayanan, C. G. Kim, C. O. Kim, M. Tsunoda, Migaku Takahashi

研究成果: Article査読

1 被引用数 (Scopus)

抄録

Magnetic Tunnel Junctions (MTJs) were fabricated on thermally oxidized Si(100) wafers by utilizing DC magnetron sputtering. Magnetic properties of MTJs with structure of Ta(50)/Cu(100)/Ta(50)/Ni80Fe20(20)/ Cu(50)/Mn75Ir25(100)/Co70Fe30(25)/ AlOx(15)/Co70Fe30(25)/Ni80Fe 20(t)/Ta(50), where t = 0, 100 and 100 Å, were investigated by using SQUID, XRD and MR analyzer. Exchange bias field is inversely proportional to temperature for t = 0 Å sample. XRD shows the improvement of (111) texture of IrMn3 and Cu after annealing. The exchange bias field decreases with increasing temperature due to thermal effect. And it is the highest for t = 100 Å due to increased crystallites size of IrMn 3. For the free layer, the temperature dependence of interlayer exchange coupling involves the same mechanism as that of exchange bias.

本文言語English
ページ(範囲)1700-1703
ページ数4
ジャーナルPhysica Status Solidi (A) Applied Research
201
8
DOI
出版ステータスPublished - 2004 6月 1

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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