Technical development of profile measurement for the soft X-ray via compton backward scattering

T. Saito, D. Oshima, K. Ueyama, S. Hidume, Y. Minamiguchi, M. Hama, Washio, R. Kuroda, S. Kashiwagi, J. Urakawa, H. Hayano

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

A compact X-ray source is required by such various fields as material development, biological science, and medical treatment. At Waseda University, we have succeeded to generate the soft X-ray of the wavelength within so-called water window region (250-500eV) via Compton backward scattering [1, 2] between 1047nm Nd:YLF laser and 4.6MeV high quality electron beam. Although this method equips some useful characters, e.g. high intensity, short pulse, energy variableness, etc, the X-ray generating system is compact enough to fit in tabletop size. In the next step, there rises two principal tasks; To make the soft X-ray intensity higher, 2-pass amplifier was utilized. To progress X-ray profile measurement techniques as preliminary experiments for biomicroscopy, we planned to irradiate X-ray to a resist film which is previously exposed by UV-lamp or get images with X-ray CCD. In this conference, we will show the experimental results and some future plans.

本文言語English
ホスト出版物のタイトルProceedings of the Particle Accelerator Conference, PAC 2005
ページ1260-1262
ページ数3
DOI
出版ステータスPublished - 2005
外部発表はい
イベントParticle Accelerator Conference, PAC 2005 - Knoxville, TN, United States
継続期間: 2005 5 162005 5 20

出版物シリーズ

名前Proceedings of the IEEE Particle Accelerator Conference
2005

Conference

ConferenceParticle Accelerator Conference, PAC 2005
国/地域United States
CityKnoxville, TN
Period05/5/1605/5/20

ASJC Scopus subject areas

  • 工学(全般)

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