Surface structure of thin CaO layers formed on CaF2(111) studied by photoelectron diffraction

Hideshi Ishii, Shoji Tanigawa, Susumu Shiraki, Tetsuya Nakama, Shinji Omori, Hiromichi Shimada, Motoyasu Imamura, Nobuyuki Matsubayashi, Akio Nishijima, Yoshimasa Nihei

    研究成果: Article査読

    6 被引用数 (Scopus)

    抄録

    Surface structure of thin CaO layers formed on the CaF2(111) surface was investigated by two types of photoelectron diffraction methods. High angular resolved X-ray photoelectron diffraction (XPED) patterns indicate that two CaO domains, CaO(111) and CaO(-1-1-1), epitaxially grew and the lattice expansion occurred parallel to the surface because of the large mismatch. The change of dominant domain orientation was observed as increasing the thickness of films. We found that 8% lateral expansion and no vertical contraction occurred in 8 Å CaO layers, compared with Ca2p scanned energy photoelectron diffraction patterns and those calculated for model structures.

    本文言語English
    ページ(範囲)545-549
    ページ数5
    ジャーナルJournal of Electron Spectroscopy and Related Phenomena
    88-91
    DOI
    出版ステータスPublished - 1998 3月

    ASJC Scopus subject areas

    • 電子材料、光学材料、および磁性材料
    • 放射線
    • 原子分子物理学および光学
    • 凝縮系物理学
    • 分光学
    • 物理化学および理論化学

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