Surface segregation of chromium in a copper-chromium alloy and its effect on formation of a native oxide layer

Shigeru Suzuki, Yukio Ishikawa, Minoru Isshiki, Yoshio Waseda

研究成果: Article査読

5 被引用数 (Scopus)

抄録

Angle-resolved X-ray photoelectron spectroscopy (AR-XPS) has been used for studying the surface segregation of chromium in a copper-0.4 mass% chromium alloy. The influence of the chromium segregation on native oxide layers formed on the surface in this alloy has also been studied. According to a simple layered model assuming thin homogeneous layers, the average surface concentration chromium was found to increase up to about 15 at% on the alloy surface by annealing up to about 1000 K under ultra high vacuum. The AR-XPS results for the alloy surface with chromium segregation, which was exposed to air, showed that the growth of the native oxide layer of copper was not significantly suppressed by segregated chromium. This small influence of chromium segregation on the native oxide layer is considered to result from the relatively high oxidation rate of copper and the microscopic heterogeneity of chromium segregation on the alloy surface.

本文言語English
ページ(範囲)2523-2526
ページ数4
ジャーナルMaterials Transactions
43
10
DOI
出版ステータスPublished - 2002 10

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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