Study on the effect of clock rise time on fault occurrence under IEMI

Naoto Saga, Takuya Itoh, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone

研究成果: Conference contribution

抄録

A method of the fault injection to a cryptographic equipment injects intentional electromagnetic interference (IEMI) on its power line. An IEMI fault is caused when the injection is superimposed on the rising portion of the clock signal, and the vulnerability increases if the clock pulse has long rise time. If the rise time is short, the clock signal has widely spread frequency spectrum, and may cause electromagnetic disturbance. The clock rise time should be considered as trade-off between resistance against fault injection and electromagnetic compatibility (EMC). An experimental study showed how clock rise time effects on occurrence of fault injection, and distribution of high frequency components of the clock signal was observed.

本文言語English
ホスト出版物のタイトル2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
出版社Institute of Electrical and Electronics Engineers Inc.
ページ数1
ISBN(電子版)9781509059973
DOI
出版ステータスPublished - 2018 6 22
イベント60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapore
継続期間: 2018 5 142018 5 18

出版物シリーズ

名前2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018

Other

Other60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
CountrySingapore
CitySuntec City
Period18/5/1418/5/18

ASJC Scopus subject areas

  • Aerospace Engineering
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

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