TY - GEN
T1 - Study on the effect of clock rise time on fault occurrence under IEMI
AU - Saga, Naoto
AU - Itoh, Takuya
AU - Hayashi, Yu-Ichi
AU - Mizuki, Takaaki
AU - Sone, Hideaki
N1 - Funding Information:
ACKNOWLEDGMENT This work was supported by JSPS KAKENHI Grant Number 17H01751.
Publisher Copyright:
© 2018 IEEE.
PY - 2018/6/22
Y1 - 2018/6/22
N2 - A method of the fault injection to a cryptographic equipment injects intentional electromagnetic interference (IEMI) on its power line. An IEMI fault is caused when the injection is superimposed on the rising portion of the clock signal, and the vulnerability increases if the clock pulse has long rise time. If the rise time is short, the clock signal has widely spread frequency spectrum, and may cause electromagnetic disturbance. The clock rise time should be considered as trade-off between resistance against fault injection and electromagnetic compatibility (EMC). An experimental study showed how clock rise time effects on occurrence of fault injection, and distribution of high frequency components of the clock signal was observed.
AB - A method of the fault injection to a cryptographic equipment injects intentional electromagnetic interference (IEMI) on its power line. An IEMI fault is caused when the injection is superimposed on the rising portion of the clock signal, and the vulnerability increases if the clock pulse has long rise time. If the rise time is short, the clock signal has widely spread frequency spectrum, and may cause electromagnetic disturbance. The clock rise time should be considered as trade-off between resistance against fault injection and electromagnetic compatibility (EMC). An experimental study showed how clock rise time effects on occurrence of fault injection, and distribution of high frequency components of the clock signal was observed.
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U2 - 10.1109/ISEMC.2018.8394009
DO - 10.1109/ISEMC.2018.8394009
M3 - Conference contribution
AN - SCOPUS:85050087848
T3 - 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
SP - 9
BT - 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Y2 - 14 May 2018 through 18 May 2018
ER -