A combination of LEED and FI-STM has been used to characterize the Bi/Si(lll) system. Two distinct phases of the f3 x V3- structure formed on the Si(lll) surface are imaged for the first time by STM and are studied as a function of coverage. Trimers of Bi atoms are clearly resolved at 1 ML whereas single Bi atom adsorption are documented at l/3 ML. The atomic geometry of these structures and the development of two phases as a function of coverage are discussed.
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