Structure of the Bi/Si(111) surface by field-ion scanning tunneling microscopy

C. Park, Raouf Z. Bakhtizin, Tomihiro Hashizume, Toshio Sakurai

研究成果: Article査読

10 被引用数 (Scopus)

抄録

A combination of LEED and FI-STM has been used to characterize the Bi/Si(lll) system. Two distinct phases of the f3 x V3- structure formed on the Si(lll) surface are imaged for the first time by STM and are studied as a function of coverage. Trimers of Bi atoms are clearly resolved at 1 ML whereas single Bi atom adsorption are documented at l/3 ML. The atomic geometry of these structures and the development of two phases as a function of coverage are discussed.

本文言語English
ページ(範囲)1416-1418
ページ数3
ジャーナルJapanese journal of applied physics
32
3 S
DOI
出版ステータスPublished - 1993 3月
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

フィンガープリント

「Structure of the Bi/Si(111) surface by field-ion scanning tunneling microscopy」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル