Structure modulation of Al0.5In0.5P studied by energy-filtered electron diffraction and high-resolution electron microscopy

Daisuke Shindo, Yuichi Konno, Sung Hwan Lim, Akiko Gomyo

研究成果: Article査読

6 被引用数 (Scopus)

抄録

Structure modulation of a III-V alloy semiconductor Al0.5In0.5P was investigated by electron diffraction and high-resolution electron microscopy (HREM). By utilizing an energy filter, the background of the electron diffraction patterns was markedly reduced and two types of the diffuse scattering were clearly revealed. One type of diffuse scattering is situated at the midpoint of the fundamental reflections while the other type is situated around the fundamental reflections. From the analysis of the HREM image, the structure modulation is interpreted to result from the ordering and the concentration modulation of Al and In. Furthermore, a structure model of Al0.5In0.5P is derived from the HREM image, and diffraction intensity calculated based on the structure model shows good agreement with the observed intensity.

本文言語English
ページ(範囲)2593-2597
ページ数5
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
37
5 A
DOI
出版ステータスPublished - 1998
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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