The structural relaxation in a Pd40Cu30Ni10P20 metallic glass was investigated by an electrical resistivity experiment. A chemical short range ordering (CSRO) process was observed together with the ordinary topological short range ordering (TSRO) one. It was found that the TSRO process was influenced by the B2O3 flux treatment that was used to improve the thermal stability. The kinetics of CSRO were examined by measuring the isothermal change in the room temperature resistivity, ρ300, after annealing for a given time. The data obtained were successfully fitted by the relaxation function and the CSRO process was a thermally activated process with an energy spectrum.
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