Structural origin of a cluster of bright spots in reverse bias electroluminescence image of solar cells based on Si multicrystals

Noritaka Usami, Kentaro Kutsukake, Kozo Fujiwara, Ichiro Yonenaga, Kazuo Nakajima

研究成果: Article査読

5 被引用数 (Scopus)

抄録

Electroluminescence (EL) imaging was utilized to investigate spatial distribution of electric properties of solar cells based on Si multicrystals with different base resistivity. A part of electrically active defects in solar cells, observed as dense dark lines In the EL image under the forward bias, was found to be detected as a cluster of bright spots in the EL image under the reverse bias especially when the base resistivity is low. This observation was accompanied with decrease in filling factor of solar cells. Local structural analysis clarified that sub-grain boundaries are responsible for the defects.

本文言語English
ページ(範囲)750011-750013
ページ数3
ジャーナルApplied Physics Express
1
7
DOI
出版ステータスPublished - 2008 7月 1

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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