Structural Characterization of Non-Crystalline Oxides by the Anomalous X-ray Scattering (AXS) Method

Yoshio Waseda, Kazumasa Sugiyama

研究成果: Article査読

1 被引用数 (Scopus)

抄録

The fundamentals of the anomalous X-ray scattering (AXS) method for materials characterization have been described by focusing our attention on the structure of non-crystalline oxide systems. This relatively new method makes it possible to provide the environmental structure around a specific element, which is not obtained from the conventional X-ray diffraction results, in multi-component non-crystalline systems. The validity and usefulness of the AXS method were demonstrated by obtaining the fine structure of GeO2 glass, ZrO2 amorphous, the Sr-La-Mn-B-O type ferromagnetic glass and the Cu-I-Mo-O type super-ionic conducting glass.

本文言語English
ページ(範囲)103-121
ページ数19
ジャーナルHigh Temperature Materials and Processes
22
2
DOI
出版ステータスPublished - 2003 1 1
外部発表はい

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Physical and Theoretical Chemistry

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