Structural and magnetic characterization of martensitic Ni-Mn-Ga thin films deposited on Mo foil

V. A. Chernenko, R. Lopez Anton, M. Kohl, J. M. Barandiaran, M. Ohtsuka, I. Orue, S. Besseghini

研究成果: Article査読

30 被引用数 (Scopus)

抄録

Three martensitic Ni51.4Mn28.3Ga20.3 thin films sputter-deposited on a Mo foil were investigated with regard to their crystal and magnetic domain structures, as well as their magnetic and magnetostrain properties. The film thicknesses, d, were 0.1, 0.4 and 1.0μm. X-ray and electron diffraction patterns revealed a tetragonal modulated martensitic phase (10 M) in the films. The surface topography and micromagnetic structure were studied by scanning probe microscopy. A maze magnetic domain structure featuring a large out-of-plane magnetization component was found in all films. The domain width, δ, depends on the film thickness as δ ∼ sqrt(d). The thickness dependencies of the saturation magnetization, saturation magnetic field and magnetic anisotropy were clarified. Beam cantilever tests on the Ni-Mn-Ga/Mo composite as a function of magnetic field showed reversible strains, which are larger than ordinary magnetostriction.

本文言語English
ページ(範囲)5461-5467
ページ数7
ジャーナルActa Materialia
54
20
DOI
出版ステータスPublished - 2006 12

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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