抄録
An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.
本文言語 | English |
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論文番号 | 07D915 |
ジャーナル | Journal of Applied Physics |
巻 | 105 |
号 | 7 |
DOI | |
出版ステータス | Published - 2009 |
ASJC Scopus subject areas
- 物理学および天文学(全般)