Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

Hiroshi Naganuma; Andras Kovacs; Tetsuro Harima; Hiromi Shima; Soichiro Okamura; Yoshihiko Hirotsu

doi:10.1063/1.3074096

Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

Hiroshi Naganuma, Andras Kovacs, Tetsuro Harima, Hiromi Shima, Soichiro Okamura, Yoshihiko Hirotsu

国際集積エレクトロニクス研究開発センター

研究成果: Article › 査読

3 被引用数 (Scopus)

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An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.

本文言語	English
論文番号	07D915
ジャーナル	Journal of Applied Physics
巻	105
号	7
DOI	https://doi.org/10.1063/1.3074096
出版ステータス	Published - 2009

ASJC Scopus subject areas

物理学および天文学（全般）

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10.1063/1.3074096

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title = "Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition",

abstract = "An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.",

author = "Hiroshi Naganuma and Andras Kovacs and Tetsuro Harima and Hiromi Shima and Soichiro Okamura and Yoshihiko Hirotsu",

note = "Funding Information: This study was partly supported by a Grant-in-Aid for Young Scientist B program Grant No. 20760474 from the Ministry of Education, Culture, Sports, Science and Technology, Japan.",

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T1 - Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

AU - Naganuma, Hiroshi

AU - Kovacs, Andras

AU - Harima, Tetsuro

AU - Shima, Hiromi

AU - Okamura, Soichiro

AU - Hirotsu, Yoshihiko

N1 - Funding Information: This study was partly supported by a Grant-in-Aid for Young Scientist B program Grant No. 20760474 from the Ministry of Education, Culture, Sports, Science and Technology, Japan.

PY - 2009

Y1 - 2009

N2 - An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.

AB - An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.

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Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

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