TY - JOUR
T1 - STM study on the interactions of C70 with the Si(100)2×1 surface
AU - Wang, Xiang Dong
AU - Xue, Qikun
AU - Hashizume, T.
AU - Shinohara, H.
AU - Nishina, Y.
AU - Sakurai, T.
N1 - Copyright:
Copyright 2015 Elsevier B.V., All rights reserved.
PY - 1994
Y1 - 1994
N2 - We have conducted a study of the adsorption, thin-film growth, and the reaction of C70 on the Si(100)2×1 surface. It is found that the crystalline thin film can be grown with good quality by keeping the substrate at approximately 120°C during deposition. C70's above the first layer can desorb at temperatures above approximately 250°C, which is similar to the situation in the bulk phase, but the first layer of the C70 film which is directly bonded to the Si(100) surface does not desorb or decompose upon heating to 1000°C. It reacts with the Si(100) substrate at temperatures above 1000°C to form the SiC(100)3×2 islands. The reaction products can finally desorb at temperatures above 1300°C, resulting in surface roughening.
AB - We have conducted a study of the adsorption, thin-film growth, and the reaction of C70 on the Si(100)2×1 surface. It is found that the crystalline thin film can be grown with good quality by keeping the substrate at approximately 120°C during deposition. C70's above the first layer can desorb at temperatures above approximately 250°C, which is similar to the situation in the bulk phase, but the first layer of the C70 film which is directly bonded to the Si(100) surface does not desorb or decompose upon heating to 1000°C. It reacts with the Si(100) substrate at temperatures above 1000°C to form the SiC(100)3×2 islands. The reaction products can finally desorb at temperatures above 1300°C, resulting in surface roughening.
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U2 - 10.1103/PhysRevB.49.7754
DO - 10.1103/PhysRevB.49.7754
M3 - Article
AN - SCOPUS:0000294909
SN - 0163-1829
VL - 49
SP - 7754
EP - 7758
JO - Physical Review B
JF - Physical Review B
IS - 11
ER -