Precise evaluation of the electrostatic potential distributions of and around samples with multiple charges using electron holography has long been a problem due to unknown perturbation of the reference wave. Here, we report the first practical application of split-illumination electron holography (SIEH) to tackle this problem. This method enables the use of a non-perturbed reference wave distant from the sample. SIEH revealed the electrostatic potential distributions at interfaces of the charged particles used for development in electrophotography and should lead to dramatic improvements in electrophotography.
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