Soft-delay-error evaluation in content-addressable memory

Naoya Onizawa, Shoun Matsunaga, Noboru Sakimura, Ryusuke Nebashi, Tadahiko Sugibayashi, Takahiro Hanyu

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

In this paper, a delay-variation effect under alpha-particle strikes is evaluated in content-addressable memories (CAMs). The particle strikes into transistors induce a current-pulse signal that causes the delay variation, resulting in a timing error, called a soft-delay error (SDE). The delay variations in two different CAMs designed in a 90nm CMOS technology are simulated in NS-SPICE using a charge-injection model that generates a current-pulse signal. The SDE effects are discussed, where one of the CAMs is a traditional 9-transistor-cell CAM and the other one is a magnetic-tunnel- junction (MTJ)/MOS hybrid CAM that operates based on a multiple-valued current-mode logic. The simulation results show that there is a trade-off between the amount of current (thus power dissipation) and the SDE effects in the MTJ/MOS hybrid CAM.

本文言語English
ホスト出版物のタイトルProceedings - 2014 IEEE 44th International Symposium on Multiple-Valued Logic, ISMVL 2014
出版社IEEE Computer Society
ページ220-225
ページ数6
ISBN(印刷版)9781479935345
DOI
出版ステータスPublished - 2014 1 1
イベント44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014 - Bremen, Germany
継続期間: 2014 5 192014 5 21

出版物シリーズ

名前Proceedings of The International Symposium on Multiple-Valued Logic
ISSN(印刷版)0195-623X

Other

Other44th IEEE International Symposium on Multiple-Valued Logic, ISMVL 2014
国/地域Germany
CityBremen
Period14/5/1914/5/21

ASJC Scopus subject areas

  • コンピュータ サイエンス(全般)
  • 数学 (全般)

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