Smaller spot formation by vector beam for higher resolution microscopy

Shunichi Sato, Yuichi Kozawa

研究成果: Conference contribution

抜粋

Smaller spot formation by using vector beams is demonstrated for achieving higher lateral resolution, which is beyond conventional diffraction limit, in confocal microscopy, twophoton microscopy and subtraction microscopy.

元の言語English
ホスト出版物のタイトルCLEO
ホスト出版物のサブタイトルScience and Innovations, CLEO-SI 2015
出版者Optical Society of America (OSA)
ページ数1
ISBN(電子版)9781557529688
DOI
出版物ステータスPublished - 2015 5 4
イベントCLEO: Science and Innovations, CLEO-SI 2015 - San Jose, United States
継続期間: 2015 5 102015 5 15

出版物シリーズ

名前CLEO: Science and Innovations, CLEO-SI 2015

Other

OtherCLEO: Science and Innovations, CLEO-SI 2015
United States
San Jose
期間15/5/1015/5/15

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

フィンガープリント Smaller spot formation by vector beam for higher resolution microscopy' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Sato, S., & Kozawa, Y. (2015). Smaller spot formation by vector beam for higher resolution microscopy. : CLEO: Science and Innovations, CLEO-SI 2015 (CLEO: Science and Innovations, CLEO-SI 2015). Optical Society of America (OSA). https://doi.org/10.1364/CLEO_SI.2015.STu2L.5