Simultaneous observation of nanometer size ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy

H. Odagawa, Y. Cho

研究成果: Conference article査読

2 被引用数 (Scopus)

抄録

A new type of scanning nonlinear dielectric microscope (SNDM), with an additional function of simultaneous observation of surface morphology, has been developed. This was achieved by using an electrically conducting atomic force microscopy cantilever as a probe needle. Using this new SNDM, simultaneous measurements of several ferroelectric materials, such as periodically polarized LiNbO3 and PZT thin films on SrTiO3 substrates, were performed. Topographic and domain images, which were simultaneously taken from the same location of the materials, were successfully obtained. The result shows that nano-sized ferroelectric domain with the width of 1.5 nm for PZT thin film having a good correlation with a topographic image were observed. Moreover ferroelectric writing and reading are demonstrated using the SNDM system.

本文言語English
ページ(範囲)29-36
ページ数8
ジャーナルFerroelectrics
251
1-4
DOI
出版ステータスPublished - 2001
イベント6th International Symposium on Ferroic Domains and Mesoscopic Structures (ISFD-6) - Nanjing, China
継続期間: 2000 5 292000 6 2

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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