Simulations of the effects of tip apex geometries on atomic force microscopy images

Masaharu Komiyama, Katsuyuki Tazawa, Kazuya Tsujimichi, Akiyasu Hirotani, Momoji Kubo, Akira Miyamoto

研究成果: Article査読

2 被引用数 (Scopus)

抄録

Simulation works on the effects of tip apex geometries on atomic force microscopy (AFM) images were examined. Tips and samples employed in those simulations were mostly made of a single component. Short-range interatomic potentials such as Lennard-Jones and Morse were used. With these potentials, it was found that a single atom tip (a tip with an atom protruding at its apex) is necessary for obtaining true atomic resolution. In many cases flat tip geometries (tips with multiple atoms at their apexes) produce various images that do not correspond to the surface atom arrangements, which may lead to various faulty AFM image interpretations.

本文言語English
ページ(範囲)4101-4104
ページ数4
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
35
7
DOI
出版ステータスPublished - 1996 7月

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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