Simulation of atomic force microscopy images of cleaved mica surfaces

Kazuya Tsujimichi, Hiroyuki Tamura, Akiyasu Hirotani, Momoji Kubo, Masaharu Komiyama, Akira Miyamoto

研究成果: Article査読

9 被引用数 (Scopus)

抄録

Taking into account the Coulomb and exchange forces, atomic force microscopy (AFM) and lateral force microscopy (LFM) simulations were performed for a Si(OH)4 tip and a cleaved mica surface under planer two-dimensional periodic boundary conditions. Imaging of the individual oxygen atoms in hexagonal oxygen rings and/or K+ ions on a cleaved mica surface strongly depended on the tip orientation and the applied force. Experimentally obtained AFM images of cleaved mica surfaces were interpreted in terms of the present simulation results.

本文言語English
ページ(範囲)4260-4264
ページ数5
ジャーナルJournal of Physical Chemistry B
101
21
出版ステータスPublished - 1997 5 22

ASJC Scopus subject areas

  • 物理化学および理論化学
  • 表面、皮膜および薄膜
  • 材料化学

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