Simulation of atomic force microscopy image variations due to tip apex size: Appearance of half spots

Masaharu Komiyama, Katsuyuki Tazawa, Kazuya Tsujimichi, Akiyasu Hirotani, Momoji Kubo, Akira Miyamoto

研究成果: Article

2 引用 (Scopus)

抜粋

Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size on AFM images were examined. A metal tip-metal sample system consisting of iron tip and copper sample was employed as a model system. Structures with half the surface periodicity, which have been observed in actual AFM measurements, were observed at certain tip apex registries. Conditions for their appearances were examined.

元の言語English
ページ(範囲)580-583
ページ数4
ジャーナルThin Solid Films
281-282
発行部数1-2
DOI
出版物ステータスPublished - 1996 8 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

フィンガープリント Simulation of atomic force microscopy image variations due to tip apex size: Appearance of half spots' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用