Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging

Masaharu Komiyama, Kazuya Tsujimichi, Katsuyuki Tazawa, Akiyasu Hirotani, Hideo Yamano, Momoji Kubo, Ewa Broclawik, Akira Miyamoto

研究成果: Article査読

13 被引用数 (Scopus)

抄録

A recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation code for calculating and evaluating surface structures) has been extended to incorporate the molecular dynamics method. Using this ACCESS-II, LFM (lateral force microscopy) as well as AFM simulations were performed under dynamic conditions. Lateral forces felt by the tip exhibited a behavior that leads to the typical stick-slip phenomenon, and their magnitudes are close to that of the vertical force. The role of the lateral forces in contact-mode AFM imaging is discussed.

本文言語English
ページ(範囲)222-227
ページ数6
ジャーナルSurface Science
357-358
DOI
出版ステータスPublished - 1996 6 20

ASJC Scopus subject areas

  • 凝縮系物理学
  • 表面および界面
  • 表面、皮膜および薄膜
  • 材料化学

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