TY - JOUR
T1 - Simplified method to prepare atomically-ordered TiO 2 (1 1 0)-(1 × 1) surfaces with steps and terraces
AU - Shimizu, Ryota
AU - Iwaya, Katsuya
AU - Ohsawa, Takeo
AU - Hasegawa, Tetsuya
AU - Hashizume, Tomihiro
AU - Hitosugi, Taro
N1 - Funding Information:
This work was supported by the World Premier International Research Center Initiative (WPI Initiative), the Global COE Program for Chemistry Innovation through Cooperation of Science and Engineering , the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan, and the A3 Foresight Program from the Japanese Society for the Promotion of Science (JSPS). We also thank Prof. Terunobu Miyazaki and Dr. Shigemi Mizukami for STM/LEED/AES measurements, and Dr. Taketoshi Minato for fruitful discussions.
PY - 2011/3/15
Y1 - 2011/3/15
N2 - An effective way to prepare atomically-ordered rutile TiO 2 (1 1 0) surfaces that have distinct step and terrace structures suitable for oxide thin film deposition is demonstrated. Only a two-step procedure, consisting of 20% HF etching and UHV-annealing at 1100 °C, was required to yield a clean (1 × 1) structure with step and terrace structures. Investigation of the surface using scanning tunneling microscopy, low-energy electron diffraction, and Auger electron spectroscopy reveals that carbon contamination is removed at around 800 °C, and straight steps with clear terraces appear at around 1000 °C.
AB - An effective way to prepare atomically-ordered rutile TiO 2 (1 1 0) surfaces that have distinct step and terrace structures suitable for oxide thin film deposition is demonstrated. Only a two-step procedure, consisting of 20% HF etching and UHV-annealing at 1100 °C, was required to yield a clean (1 × 1) structure with step and terrace structures. Investigation of the surface using scanning tunneling microscopy, low-energy electron diffraction, and Auger electron spectroscopy reveals that carbon contamination is removed at around 800 °C, and straight steps with clear terraces appear at around 1000 °C.
KW - Oxide electronics
KW - Scanning probe microscopy
KW - Surface science
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U2 - 10.1016/j.apsusc.2010.12.127
DO - 10.1016/j.apsusc.2010.12.127
M3 - Article
AN - SCOPUS:79951680380
VL - 257
SP - 4867
EP - 4869
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
IS - 11
ER -