Simple scanning phase-contrast X-ray tomography using intensity detectors

Hidekazu Takano, Sho Shimomura, Shigeki Konishi, Hiroaki Azuma, Yoshiyuki Tsusaka, Yasushi Kagoshima

研究成果: Article査読

3 被引用数 (Scopus)

抄録

We have developed a phase-contrast X-ray microtomography system based on scanning microscopy with X-ray focusing optics. The system is very simple because only two conventional intensity detectors and a half-obstructing-plate for the second detector are installed into the conventional scanning microscopy setup. We constructed the system with a 450-nm-size focused beam of a 10 keV X-ray. The system is operated with a sampling rate of 100 Hz. Adopting data correction using a guide object and data interpolation procedure in sinograms, tomographic reconstruction images with a high spatial resolution and phase sensitivity are obtained.

本文言語English
論文番号040204
ジャーナルJapanese journal of applied physics
52
4 PART 1
DOI
出版ステータスPublished - 2013 4月 1
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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